Garfield++
Garfield++ is a toolkit for the detailed simulation of particle detectors based on ionisation measurement in gases and semiconductors. The main area of application is currently in micropattern gaseous detectors. Garfield++ shares functionality with the Garfield program. The main differences are the more up-to-date treatment of electron transport, the possibility to simulate silicon sensors, and the user interface, which is based on ROOT.
Garfield++ currently offers the following techniques for calculating electric fields:
- solutions in the thin-wire limit for devices made of wires and planes;
- interfaces with the finite element programs Ansys, Elmer, Comsol and CST, which can compute approximate fields in nearly arbitrary three-dimensional configurations with dielectrics and conductors;
- an interface with the Synopsys Sentaurus device simulation program;
- an interface with the neBEM field solver.
For calculating the transport properties of electrons in gas mixture, an interface to the Magboltz program is available.
The ionisation pattern produced by relativistic charged particles can be simulated using the program Heed. For simulating the ionisation produced by low-energy ions, results calculated using the SRIM software package can be imported.